This microscope is generally used when information is required at the nm scale and can operate in several modes depending on the nature of the sample. In combination with the analytical capabilities and other specialised attachments, the microscope is a highly versatile instrument.
Electron source: Field emission gun
Accelerating voltage: 500 V- 30 kV
Resolution: 2 nm at 30 kV (SE)
Imaging detectors: Everhart-Thornley (SE/BSE), Solid State Backscattered Electron, Large Field, Gaseous Secondary Electron, Gaseous Backscattered Electron, Gaseous Analytical, CCD Camera
Imaging modes: High, low vacuum and environmental
Analytical Capabilities: EDS (Oxford Instruments 80 mm2 X-Max SDD, MnKα resolution at 124 eV)
Attachments: Quorum PP2000 Cryo System, FEI Peltier stage (-10 °C to 22 °C)