Electron tomography of nanostructures

Takeshi Kasama
Jakob Birkedal Wagner
Current analytical transmission electron microscope (TEM) instruments are capable of achieving atomic resolution imaging. However, the information obtained in TEM is typically projected through the thickness of the specimens and gives an ambiguous picture of the 3-dimensional properties of nano-structures. In electron tomography TEM measurements are obtained at different specimen tilt-angles and 3-dimensional images of structures are reconstructed from them. One major challenge in performing accurate tomographic reconstructions is the limited specimen tilt-range typically available. This project involves using both experiments and simulations to analyse the artefacts introduced to tomographic reconstructions under typical experimental conditions and using the current reconstruction software. Methods of eliminating artefacts will also be considered.


 

Takeshi Kasama
Senior Researcher
DTU Cen
+45 45 25 64 75
Jakob Birkedal Wagner
Professor, Scientific director
DTU Cen
+45 45 25 64 71