MEMS for transmission electron microscope applications

Christian Danvad Damsgaard
Jakob Birkedal Wagner
The opportunity of combining electrical and mechanical control with the possibility of making electron transparent solutions makes MicroElectroMechanical Systems (MEMS) highly favourable as sample manipulators and/or sensors for use in Transmission Electron Microscopes (TEM). 
Several projects are available within this topic:
1. Sample heater and temperature sensor 
2. Electrical bias and optical path

 

Christian Danvad Damsgaard
Associate professor
DTU Cen
+45 45 25 64 87
Jakob Birkedal Wagner
Professor, Scientific director
DTU Cen
+45 45 25 64 71
http://www.cen.dtu.dk/english/research/projects/new-mems-for-transmission-electron-microscope-applications
22 SEPTEMBER 2017