Counting Statistics and Accuracy within Electron Microscopy

Jakob Birkedal Wagner
Thomas Willum Hansen
Many conclusions about coarsening and sintering mechanisms of nanoparticles are based on extracting particle size distributions (PSD) before and after treating the sample under a given set of conditions. However, in most cases, these PSD’s are extracting either manually or via some routine from TEM images. In the first case, the accuracy is to a large extent based on the discretion of the observer. In the second case, where the routine will trigger on contrast in the images, morphology and structure of the material in question plays a large role. 
In this project, we will determine the validity of existing routines and try to develop novel and more bullet proof counting routines using electron microscopy and to some extent Rietveldt refinement of XRD patterns. The developed routines could be extended to other nanostructures.


 

Jakob Birkedal Wagner
Professor, videnskabelig direktør
DTU Cen
45 25 64 71
Thomas Willum Hansen
Seniorforsker
DTU Cen
45 25 64 76